Emil Pinčík : rechercher sur Z-Library

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1

Low temperature plasma anodic oxidation of silicon through thin aluminium overlayers

Jiří Bartoš, Emil Pinčík

Journal:

Thin Solid Films

Année:

1994

Langue:

english

Fichier:

PDF, 441 KB

english, 1994

2

Passivation of a-Si:H-based structures in KCN and HCN solutions and its application on p-i-n solar cell

Pinčík, Emil, Kobayashi, Hikaru, Takahashi, Masao, Brunner, Róbert, Jurečka, Stanislav

Journal:

Journal of the Chinese Advanced Materials Society

Année:

2013

Langue:

english

Fichier:

PDF, 587 KB

english, 2013

3

Lattice Deformation and Defect Structure of GaAs/Native Oxide Interfaces

Lànyi, S., Wolcyrz, M., Pinčík, Emil, Nadazdy, V.

Journal:

Materials Science Forum

Année:

1989

Fichier:

PDF, 341 KB

1989

4

9th Solid State Surfaces and Interfaces, November 21-24, 2016, Piešťany Slovakia

Pinčík, Emil, Brunner, Róbert, Bačová, Silvia, Zitto, Peter

Journal:

Journal of Electrical Engineering

Année:

2017

Langue:

english

Fichier:

PDF, 116 KB

english, 2017

5

Temperature dependence of photoluminescence peaks of porous silicon structures

Brunner, Róbert, Pinčík, Emil, Kučera, Michal, Greguš, Ján, Vojtek, Pavel, Zábudlá, Zuzana

Journal:

Journal of Electrical Engineering

Année:

2017

Langue:

english

Fichier:

PDF, 265 KB

english, 2017

6

Morphology and FT IR spectra of porous silicon

Kopani, Martin, Mikula, Milan, Kosnac, Daniel, Gregus, Jan, Pincik, Emil

Journal:

Journal of Electrical Engineering

Année:

2017

Langue:

english

Fichier:

PDF, 1.03 MB

english, 2017

7

About complex refractive index of black Si

Pinčík, Emil, Brunner, Robert, Kobayashi, Hikaru, Mikula, Milan

Journal:

Journal of Electrical Engineering

Langue:

english

Fichier:

PDF, 258 KB

english

8

Plasma anodic oxidation of semiinsulating GaAs

Emil Pinčík, Katarína Gmucová, Jiří Bartoš, Michal Kučera, Matej Jergel, Robert Brunner

Journal:

Applied Surface Science

Année:

1996

Langue:

english

Fichier:

PDF, 600 KB

english, 1996

9

On interface properties of ultra-thin and very-thin oxide/a-Si:H structures prepared by oxygen based plasmas and chemical oxidation

Emil Pinčík, Hikaru Kobayashi, Rudolf Hajossy, Helena Glesková, Masao Takahashi, Matej Jergel, Róbert Brunner, Luc Ortega, Michal Kučera, Martin Kráľ, Jaroslav Rusnák

Journal:

Applied Surface Science

Année:

2007

Langue:

english

Fichier:

PDF, 1.68 MB

english, 2007

10

International conference: Progress in Applied Surface, Interface, and Thin Film Science – Solar Renewable Energy News II (SURFINT – SREN II), Florence, November 15–20, 2009, Italy

Journal:

Applied Surface Science

Année:

2010

Langue:

english

Fichier:

PDF, 76 KB

english, 2010

11

On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties

Stanislav Jurečka, Hikaru Kobayashi, Masao Takahashi, Taketoshi Matsumoto, Mária Jurečková, Ferdinand Chovanec, Emil Pinčík

Journal:

Applied Surface Science

Année:

2010

Langue:

english

Fichier:

PDF, 801 KB

english, 2010

12

Solid state surfaces and interfaces

Reinhard Denecke, Józef Korecki, Emil Pinčik, Pavel Jelinek, Krzysztof Malarz

Journal:

Central European Journal of Physics

Année:

2009

Langue:

english

Fichier:

PDF, 199 KB

english, 2009

13

Study of density of interface states in MOS structure with ultrathin NAOS oxide

Stanislav Jurečka, Hikaru Kobayashi, Woo-Byoung Kim, Masao Takahashi, Emil Pinčík

Journal:

Central European Journal of Physics

Année:

2012

Langue:

english

Fichier:

PDF, 304 KB

english, 2012

14

Passivation of Si-based structures in HCN and KCN solutions

Emil Pinčík, Hikaru Kobayashi, Jaroslav Rusnák, Masao Takahashi, Milan Mikula, Woo Byoung Kim, Michal Kučera, Robert Brunner, Stanislav Jurečka

Journal:

Applied Surface Science

Année:

2012

Langue:

english

Fichier:

PDF, 1.51 MB

english, 2012

15

The effect of KCN passivation on IR spectra of a-Si based structures

Martin Kopani, Milan Mikula, Naozumi Fujiwara, Masao Takahashi, Emil Pinčík

Journal:

Applied Surface Science

Année:

2012

Langue:

english

Fichier:

PDF, 380 KB

english, 2012

16

Properties of charge states in MOS structure with ultrathin oxide layer

Stanislav Jurečka, Hikaru Kobayashi, Masao Takahashi, Taketoshi Matsumoto, Emil Pinčík

Journal:

Applied Surface Science

Année:

2012

Langue:

english

Fichier:

PDF, 690 KB

english, 2012

17

On formation of thin SiO2/a-Si:H interface when biased oxidized semiconductor surface interacts with plasma or liquid solution

Emil Pinčík, Hikaru Kobayashi, Masao Takahashi, Róbert Brunner, Stanislav Jurečka, Jaroslav Rusnák

Journal:

Central European Journal of Physics

Année:

2007

Langue:

english

Fichier:

PDF, 458 KB

english, 2007

18

Multifractal analysis of textured silicon surfaces

Jurečka, Stanislav, Angermann, Heike, Kobayashi, Hikaru, Takahashi, Masao, Pinčík, Emil

Journal:

Applied Surface Science

Année:

2014

Langue:

english

Fichier:

PDF, 1.32 MB

english, 2014

19

About electrical properties of passivated SiO2/Si structures prepared electro-chemically in HClO4 solutions

Pinčík, Emil, Kobayashi, Hikaru, Rusnák, Jaroslav, Takahashi, Masao, Brunner, Robert

Journal:

Applied Surface Science

Année:

2013

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2013

20

Properties of HfO2/ultrathin SiO2/Si structures and their comparison with Si MOS structures passivated in KCN solution

Pinčík, Emil, Kobayashi, Hikaru, Matsumoto, Taketoshi, Takahashi, Masao, Mikula, Milan, Brunner, Róbert

Journal:

Applied Surface Science

Année:

2014

Langue:

english

Fichier:

PDF, 677 KB

english, 2014

21

Progress in Applied Surface, Interface and Thin Film Science 2012 Solar Renewable Energy News III, May 14–18, 2012, Florence, Italy (SURFINT-SREN III)

Journal:

Applied Surface Science

Année:

2013

Langue:

english

Fichier:

PDF, 92 KB

english, 2013

22

Solid State Surfaces and Interfaces VIII

Journal:

Applied Surface Science

Année:

2014

Langue:

english

Fichier:

PDF, 610 KB

english, 2014

23

On determination of properties of ultrathin and very thin silicon oxide layers by FTIR and X - ray reflectivity

Kopani, Martin, Jergel, Matej, Kobayashi, Hikaru, Takahashi, Masao, Brunner, Robert, Mikula, Milan, Imamura, Kentarou, Jurecka, Stanislav, Pincik, Emil

Journal:

MRS Proceedings

Année:

2008

Langue:

english

Fichier:

PDF, 83 KB

english, 2008

24

Aerodynamic model of spark discharge

Pincik, Emil, Hajossy, Rudolf, Brunner, Robert

Journal:

Journal of the Chinese Advanced Materials Society

Année:

2013

Langue:

english

Fichier:

PDF, 241 KB

english, 2013

25

Photoluminescence of Passivated a-Si:H

Brunner, Róbert, Kobayashi, Hikaru, Kučera, M., Takahashi, Masao, Rusnák, Jaroslav, Pinčík, Emil

Journal:

Materials Science Forum

Année:

2009

Langue:

english

Fichier:

PDF, 1.98 MB

english, 2009

26

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

Pincik, Emil, Kobayashi, Hikaru, Jurecka, Stanislav, Jergel, Matej, Gleskova, Helena, Takahashi, Masao, Brunner, Robert, Fujiwara, Naozumi, Mullerova, Jarmila, Chu, Junhao, Lai, Zongsheng, Wang, Lianw

Année:

2012

Langue:

english

Fichier:

PDF, 1.35 MB

english, 2012

27

On Topographic Properties of Semiconductor Surfaces and Thin Film Systems

Jurečka, Stanislav, Kobayashi, Hikaru, Takahashi, Masao, Brunner, Róbert, Madani, Mohammad, Pinčík, Emil

Journal:

Materials Science Forum

Année:

2009

Langue:

english

Fichier:

PDF, 311 KB

english, 2009

28

On Similar Electrical, Optical and Structural Properties of MOS Structures Prepared on a-Si:H/c-Si, Porous Silicon/c-Si, and c-Si

Pinčík, Emil, Kobayashi, Hikaru, Brunner, Róbert, Takahashi, Masao, Rusnák, Jaroslav, Jergel, Matej

Journal:

Materials Science Forum

Année:

2009

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2009

29

Investigation of Deep Interface Traps in Very-Thin Oxide/Si Structures Prepared at Low Temperatures Using Chemical Solutions

Rusnák, Jaroslav, Ružinský, Michal, Imamura, Kentaro, Matsumoto, Taketoshi, Štefečka, Miloslav, Takahashi, Masao, Kobayashi, Hikaru, Pinčík, Emil

Journal:

Materials Science Forum

Année:

2009

Langue:

english

Fichier:

PDF, 485 KB

english, 2009

30

The photoluminescence of multicolor silicon

Pincik, Emil, Brunner, Róbert, Kobayashi, Hikaru, Mikula, Milan, Vojtek, Pavel, Greguš, Ján, Zábudlá, Zuzana, Imamura, Kentaro, Švec, Peter

Journal:

Journal of the Chinese Advanced Materials Society

Année:

2016

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2016

31

Interaction of KCN solutions with Si-based thin films

Pincik, Emil, Brunner, Robert, Kobayashi, Hikaru, Takahashi, Masao, Mikula, Milan

Journal:

Journal of the Chinese Advanced Materials Society

Année:

2015

Langue:

english

Fichier:

PDF, 629 KB

english, 2015

32

Photoluminescence investigation of thin film a-Si:H-based structures passivated in cyanide solution

Brunner, Róbert, Pinčík, Emil, Kučera, Michal, Mikula, Milan

Journal:

Journal of the Chinese Advanced Materials Society

Année:

2016

Langue:

english

Fichier:

PDF, 691 KB

english, 2016

33

Effect of HCN passivation on silicon oxide thin layer

Kopani, Martin, Mikula, Milan, Pincik, Emil, Kobayashi, Hikaru, Takahashi, Masao

Journal:

Journal of the Chinese Advanced Materials Society

Année:

2017

Langue:

english

Fichier:

PDF, 720 KB

english, 2017

34

Effect of etching time on structure of p-type porous silicon

Kopani, Martin, Mikula, Milan, Kosnac, Daniel, Vojtek, Pavol, Gregus, Jan, Vavrinsky, Erik, Jergel, Matej, Pincik, Emil

Journal:

Applied Surface Science

Année:

2018

Langue:

english

Fichier:

PDF, 945 KB

english, 2018

35

Angle- and polarization resolved antireflection properties of black silicon prepared by electrochemical etching supported by external electric field

Müllerová, Jarmila, Scholtz, Ľubomír, Ďurišová, Jana, Pinčík, Emil, Solanská, Michaela, Pudiš, Dušan

Journal:

Applied Surface Science

Année:

2018

Langue:

english

Fichier:

PDF, 1.13 MB

english, 2018

36

Progress in applied surface, interface and thin film science 2017

Pincik, Emil, Matsumoto, Taketoshi

Journal:

Applied Surface Science

Année:

2018

Langue:

english

Fichier:

PDF, 972 KB

english, 2018

37

[IEEE 2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (2018.10.21-2018.10.24)] 2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Optical Properties of Thin Black Silicon Films Prepared Electrochemically on the High Doped N-Type C-Si Without Illumination

Brunner, Robert, Vojtck, Pavel, Zabudla, Zuzana, Mikula, Milan, Pincik, Emil

Année:

2018

Langue:

english

Fichier:

PDF, 247 KB

english, 2018

38

AIP Conference Proceedings [AIP Publishing APPLIED PHYSICS OF CONDENSED MATTER (APCOM 2019) - Strbske Pleso, Slovak Republic (19–21 June 2019)] APPLIED PHYSICS OF CONDENSED MATTER (APCOM 2019) - Microstructure and optical properties of layers formed by anodic etching of silicon

Jurečka, Stanislav, Králik, Martin, Pinčík, Emil

Année:

2019

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2019

39

[IEEE 2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice (2018.10.21-2018.10.24)] 2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Photoluminescence of Inhomogeneous Porous P-Type Si

Brunner, Robert, Vojtek, Pavel, Zabudla, Zuzana, Pincik, Emil

Année:

2018

Langue:

english

Fichier:

PDF, 432 KB

english, 2018